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News Release from: CSMA (Centre for Surface and Materials Analysis)
Edited by the Printingtalk Editorial
Team on 03 January 2007
Advanced Spectrometer Analyses Poor
Printing
A new Kratos Axis Ultra X-ray photoelectron spectrometer, claimed to be one of the most advanced machines of its kind in the world, has been incorporated in to the surface analysis laboratory at CSMA.
A new Kratos Axis Ultra X-ray photoelectron spectrometer, claimed to be one of the most advanced machines of its kind in the world, has been incorporated in to the surface analysis laboratory at CSMA CSMA believes that the investment will further enhance its surface analysis resources used by the printing industry, amongst other manufacturing sectors, to research product improvements and identify potential problems
This article was originally published on Printingtalk on 22 Jul 2004 at 8.00am (UK)
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According to CSMA, XPS (X-ray photoelectron spectroscopy) provides quantified elemental and oxidation-state information and the increased capabilities include imaging and depth profiling.
That means that from the outer surface, through to the bulk of the materials, CSMA can identify which elements are present and how much is there.
Imaging allows chemical mapping of elements and oxidation-states.
CSMA explained that for the printing industry, the applications could include analysis of printing failures.
The company said that it has looked at several problems of packaging printing, whereby the print fails by rubbing, or flaking off.
The XPS allows analysis of good and bad samples and comparisons are then made.
That analysis can often highlight changes in raw materials as the amount of an important element may vary causing problems.
If a contamination is found CSMA can investigate the printing process to discover where the contamination is introduced, added the company.
The machinery will facilitate quantified elemental depth profiling using ion beam etching, as well as non-destructive angle-resolved depth profiling.
That type of analysis provides a clearer picture of any buried defects and interfaces present in a sample that could be causing problems, such as de-laminations, added CSMA.
The new XPS also allows complex chemical-state information to be more easily identified as previously overlapping chemical peaks become more distinctive thanks much higher data resolution.
Chris Pickles, managing director of CSMA, commented: "The new Kratos Axis XPS is an important investment for CSMA as, combined with the analysis skills and experience of the team here, it cements the company's position as a world leader in the field of surface analysis.
There are no other labs in the world that can boast the same level of specialist expertise.".
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